European Symp. on Reliability of Electron Devices, Failure Physics and Analysis

›8:00 (40min)

Invited paper - EOBT: from past to future
Ludwig Balk, Univ. Wuppertal (Germany)

›8:00 (1h20)

Workshop : Advanced tools and techniques flash presentations

›8:00 (1h40)

Packages & Assembly

› Room TBD

›8:40 (1h)

Failure Analysis

›9:00 (1h20)

Space, Aeronautic and Embedded Systems
André Durier, Sonia Ben Dhia

› Room TBD

›9:20 (1h)

Tutorial : MEMS Failure modes, FA and reliability challenges
Jérémie DHENNIN, Elemca (F)

› Room TBD

›9:40 (40min)

Invited Paper : Electromigration, still a reality for 3D ICs ?
Stéphane MOREAU, CEA-LETI (F)

›9:40 (40min)

Workshop : Advanced tools and techniques flash presentations

›10:20 (20min)

Author's Corner & Coffee break

›10:40 (1h20)

Workshop : Research Student Speed Dating

›11:00 (1h)

Tutorial : Minimizing Defects by Design for Soldering
Thomas AHRENS, TrainAlytics GmbH (Germany)

› Room TBD

›12:00 (20min)

Buffet & Author's Corner

›12:20 (1h)

Buffet & Posters

›12:20 (1h)

Photonic Devices
Poster session

›12:20 (1h)

Photovoltaic & Organic Devices
Poster session

›12:20 (1h)

Space, Aeronautic and Embedded Systems
Poster session

›12:20 (1h)

Si Technologies & Nanoelectronics: Hot carriers, high K, gate materials
Poster session

›12:20 (1h)

Si Technologies & Nanoelectronics: Low K, Cu Interconnects
Poster session

›13:20 (2h20)

Workshop - Modeling the reliability at system Level: tools and methodologies

›13:20 (40min)

Invited paper: A unified multiple stress reliability model for microelectronic devices – Application to 1.55 µm DFB laser diode module for space validation.
Alain Bensoussan, Ephraim Suhir, Phil Henderson and Mustapha Zahir

›13:20 (40min)

Packages & Assembly

› Room TBD

›14:00 (1h40)

Photonic Devices

› Room TBD

›14:00 (1h40)

Tutorial : Avoiding Flex Cracks in Ceramic Capacitors (CerCaps): Analytical Tool for a Reliable Failure Analysis and Guidance for Positioning CerCaps on PCBs
Gert VOGEL, SIEMENS AG (Germany)

› Room TBD

›15:40 (40min)

Author's Corner & Coffee break

›16:20 (40min)

Tutorial : Radiation effects on components at space level
Robert ECOFFET (CNES)

› Room TBD

›16:20 (1h40)

Photovoltaic & Organic Devices

› Room TBD

›16:20 (1h40)

Workshop : Advanced tools and techniques flash presentations

›16:20 (1h40)

MEMS, MOEMS, NEMS & Nano-objects

› Room TBD

›17:00 (40min)

Tutorial : Radiation and COTS at ground level
Jean-Luc AUTRAN, Université Marseille (F)

› Room TBD

›18:30 (1h)

Welcome cocktail at Toulouse City Hall