08:00
09:00
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11:00
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14:00
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16:00
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23:00
›8:00 (40min)
›8:00 (1h40)
›8:00 (1h40)
›8:00 (2h20)
›9:40 (40min)
Invited Paper : Failure analysis of photonic devices by high resolution cathodoluminescence
David GACHET, Attolight AG – Switzerland
David GACHET, Attolight AG – Switzerland
›9:40 (40min)
›10:20 (40min)
›11:00 (40min)
Invited Paper : Impacts of plasma process-induced damage on MOSFET parameter variability and reliability
Koji ERIGUCHI, Univ. of Kyoto (Japan)
Koji ERIGUCHI, Univ. of Kyoto (Japan)
›11:00 (1h20)
›11:00 (1h20)
›11:00 (1h20)
›12:20 (20min)
›12:40 (1h40)
›12:40 (1h40)
›12:40 (1h40)
›14:20 (40min)
Invited Paper : Vertical Power Devices Based on Bulk GaN Substrates: high field related issues
Isik KIZILYALLI, AVOGY – USA
Isik KIZILYALLI, AVOGY – USA
›14:20 (1h40)
Tutorial : FA (=Failure Analysis and Anamnesis) and reliability at system level
Peter JACOB, EMPA Duebendorf (Switzerland)
Peter JACOB, EMPA Duebendorf (Switzerland)
›15:00 (1h)
›16:00 (40min)
›16:40 (1h40)
Tutorial : Mission profile and reliability on power electronics
Prof. Ke Ma and Prof. Huai WANG, Aalborg University Peter de PLACE RIMMEN, Danfoss Power Electronics
Prof. Ke Ma and Prof. Huai WANG, Aalborg University Peter de PLACE RIMMEN, Danfoss Power Electronics
›16:40 (1h40)
›19:00 (4h30)
