Invited paper: A unified multiple stress reliability model for microelectronic devices – Application to 1.55 µm DFB laser diode module for space validation.
Alain Bensoussan, Ephraim Suhir, Phil Henderson and Mustapha Zahir
Tutorial : Avoiding Flex Cracks in Ceramic Capacitors (CerCaps): Analytical Tool for a Reliable Failure Analysis and Guidance for Positioning CerCaps on PCBs
Room TBD
