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Invited paper - EOBT: from past to future
Workshop : Advanced tools and techniques flash presentations
Packages & Assembly
Failure Analysis
Space, Aeronautic and Embedded Systems
Tutorial : MEMS Failure modes, FA and reliability challenges
Invited Paper : Electromigration, still a reality for 3D ICs ?
Workshop : Advanced tools and techniques flash presentations
Workshop : Advanced tools and techniques flash presentations
Packages & Assembly
Failure Analysis
Space, Aeronautic and Embedded Systems
Tutorial : MEMS Failure modes, FA and reliability challenges
Invited Paper : Electromigration, still a reality for 3D ICs ?
Workshop : Advanced tools and techniques flash presentations
Room TBD
Workshop - Modeling the reliability at system Level: tools and methodologies
Invited paper: A unified multiple stress reliability model for microelectronic devices – Application to 1.55 µm DFB laser diode module for space validation.
Packages & Assembly
Photonic Devices
Tutorial : Avoiding Flex Cracks in Ceramic Capacitors (CerCaps): Analytical Tool for a Reliable Failure Analysis and Guidance for Positioning CerCaps on PCBs
Invited paper: A unified multiple stress reliability model for microelectronic devices – Application to 1.55 µm DFB laser diode module for space validation.
Packages & Assembly
Photonic Devices
Tutorial : Avoiding Flex Cracks in Ceramic Capacitors (CerCaps): Analytical Tool for a Reliable Failure Analysis and Guidance for Positioning CerCaps on PCBs
Invited Paper : EOBT: from past to future
Failure Analysis
Photonic Devices
Workshop : Round table OEMs vs components providers
Si Technologies & Nanoelectronics: Hot carriers, high K, gate materials
Invited Paper : Failure analysis of photonic devices by high resolution cathodoluminescence
Advanced tools and techniques flash presentations
Failure Analysis
Photonic Devices
Workshop : Round table OEMs vs components providers
Si Technologies & Nanoelectronics: Hot carriers, high K, gate materials
Invited Paper : Failure analysis of photonic devices by high resolution cathodoluminescence
Advanced tools and techniques flash presentations
Invited Paper : Vertical Power Devices Based on Bulk GaN Substrates: high field related issues
Tutorial : FA (=Failure Analysis and Anamnesis) and reliability at system level
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Si Technologies & Nanoelectronics: ESD, Latch-up, Radiation Effects
Microwave and Power Wide Bandgap Devices
Tutorial : FA (=Failure Analysis and Anamnesis) and reliability at system level
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Si Technologies & Nanoelectronics: ESD, Latch-up, Radiation Effects
Microwave and Power Wide Bandgap Devices
Tutorial : Mission profile and reliability on power electronics
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Si Technologies & Nanoelectronics: ESD, Latch-up, Radiation Effects
Workshop : EUFANET : “FA at (sub)system level
Workshop : Advanced tools and techniques "Reliability & material characterization"
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Si Technologies & Nanoelectronics: ESD, Latch-up, Radiation Effects
Workshop : EUFANET : “FA at (sub)system level
Workshop : Advanced tools and techniques "Reliability & material characterization"
Invited Paper : Destruction Failure Analysis and International Reliability Test Standard for Power Devices
European FIB User Group (EFUG)
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Power Devices Smart-power devices, IGBT, thyristors, High voltage devices, Thermal management
Invited Paper : Plasma FIB development for 3D IC structures investigations and X-ray tomography sample preparation
European FIB User Group (EFUG)
Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Power Devices Smart-power devices, IGBT, thyristors, High voltage devices, Thermal management
Invited Paper : Plasma FIB development for 3D IC structures investigations and X-ray tomography sample preparation
