Committees > Technical Program

Technical Program Chairs
 
H. FREMONT IMS, University of Bordeaux (France)
F. MARC IMS, University of Bordeaux (France)

Full Technical Program Committee

Sub-committee Chairs
 
Topic A: Quality and Reliability Assessment – Techniques and Methods for Devices and Systems
Ninoslav D. STOJADINOVIC University of Nis (Serbia)
Bruno FOUCHER AIRBUS GROUP INNOVATIONS (France)
 
Topic B1: Si-Technologies & Nanoelectronics: Hot carriers, high K, gate materials
Alain BRAVAIX ISEN-IM2PN (France)
Jim STATHIS IBM Research (USA)
 
Topic B2: Si-Technologies & Nanoelectronics: Low K, Cu Interconnects
Hervé JAOUEN STMicroelectronics (France)
Eckhard LANGER Globalfoundries (Germany)
 
Topic B3: Si-Technologies & Nanoelectronics: ESD, Latch-up, radiation effects:
Philippe GALY STMicroelectronics (France)
Fabrice CAIGNET LAAS-CNRS (France)
Vesselin VASSILEV (NOVORELL Technologies - USA)
 
Topic C: Failure Analysis
Ralf HEIDERHOFF Bergische Universität Wuppertal (Germany)
Olivier CREPEL AIRBUS GROUP INNOVATIONS (France)
 
Topic D1: Microwave and Power Wide Band-gap Devices
Gaudenzio MENEGHESSO University of Padova (Italy)
Nathalie LABAT IMS, University Bordeaux (France)
Peter FRIEDRICHS INFINEON - Germany
 
Topic D2: Photonic Devices
Massimo VANZI University of Cagliari (Italy)
Matteo MENEGHINI University of Padova (Italy)
 
Topic D3: Photovoltaic & Organic Devices
Nicola WRACHIEN University of Padova (Italy)
 
Topic E1: Packages & Assembly
K. WEIDE-ZAAGE University of Hannover (GER)
Geneviève DUCHAMP IMS, University Bordeaux (France)
 
Topic E2: MEMS, MOEMS, NEMS & Nano-objects
George PAPAIOANNOU University of Athens (Greece)
Fabio COCCETTI FIALAB (France)
 
Topic F: Power Devices
Patrick TOUNSI INSA, LAAS-CNRS (France)
Eckhard WOLFGANG ECPE (Germany)
 
Topic G: Space, Aeronautic and Embedded Systems
Sonia BEN DHIA INSA, LAAS-CNRS (F)
Fabian Vargas Catholic University - PUCRS (Brazil)
André DURIER IRT Saint-Exupéry (France)
Florent MILLER AIRBUS GROUP INNOVATIONS (France)
 
Topic H: European FIB User Group (EFUG)
H. BENDER IMEC (BE)
F. ALTMANN Fraunhofer IWM Halle (GER)
Hélène CHAUVIN Thales Group (France)
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