ESREF 2015, the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, will take place in Toulouse (France) from 5th to 9th October 2015.
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
A word from the conference chairs
For this 26th year of ESREF conference we have a quite exciting program. For its first time in Toulouse - world center for aeronautics with Airbus assembly line, European capital of the space industry and number 1 in France for embedded electronic systems, in addition to the core topics of the conference, specific topics are dedicated to these applications involving severe environment and harsh reliability challenges.
The conference opening starts on Monday afternoon, October 5 with two keynote papers:
- ChemCam instrument on the Curiosity rover: from R&D to operations on Mars ; be reliable or die… - Sylvestre MAURICE, IRAP (France)
- Towards Hardware Cyber security - Ramesh KARRI, Polytechnic Institute of New York University (USA)
and will be followed by the opening of the exhibition and the IRPS, IPFA & ISTFA exchange best papers.
From Tuesday to Thursday, the conference is organized in three parallel tracks for the regular sessions with 9 invited speakers who are recognized experts in their field and a fourth track for workshops and tutorials. Check the detailed program of the tutorials and of the workshops. Friday morning, October 9, is only dedicated to workshops.
We are looking forward to welcoming you for a memorable experience!
Marise BAFLEUR Philippe PERDU
ESREF 2015 Chair ESREF 2015 Vice-Chair
